Multi-light scheme,low-angle & dark-field light,highlight faint cracks,suppress reflection
Self-developed AI algorithm,micron-level defect detection
AI segmentation extracts defect area & contour
Built-in measurement module,output defect size & area data
Results linked to SN code,one record per piece
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Project |
Specifications |
| Product Overview |
Screen crack & edge inspector,multi-light + AI segmentation, detect low-contrast weak defects,locatable measurable traceable results for panel factory outgoing inspection |
| Challenges Solved |
Tiny low-contrast edge defects disturbed by reflection & texture. Traditional vision needs frequent tuning, unstable and prone to missed weak defects |
| Inspect Performance |
Crack|Chipping|Scratch|Foreign Matter|Contamination| Edge Damage|Bright/Dark Spot Auxiliary Check|OCR / Barcode Binding |
| Application Advantages |
・Multi-light scheme to highlight faint cracks and suppress reflection ・Self-developed AI vision for micron-level defect recognition ・AI segmentation extracts defect region & contour ・Built-in module quantifies defect dimension ・SN binding,one record per screen ・Full recheck logs for traceback & data analysis
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